A Study on the Structural, Morphological and Optical Properties of Cu2-xse Thin Films Deposited by Thermal Evaporation

In this work, the influence of post-annealing on structural, morphological, and optical properties copper selenide thin films deposited glass substrate by thermal evaporation was investigated in detail. The process at different ambient temperatures a nitrogen atmosphere applied to room temperature. X-ray diffraction (XRD) patterns showed presence cubic Cu2-xSe phase, it observed that crystallinity improves with increasing annealing addition, deduced average crystallite size increased Scanning electron microscopy (SEM) atomic force (AFM) were employed investigate surface morphology films. It seen all samples have compact densely packed grains become larger. Surface roughness from 11nm 53 nm as temperature increased. On other hand, as-deposited annealed utilizing UV-Visible spectrophotometer. direct bandgap energies estimated be 2.34 eV, 2.31 2.29 eV using well-known Tauc relation, respectively. energy also calculated derivative spectroscopy technique.